Titlebar

Export bibliographic data
Literature by the same author
plus on the publication server
plus at Google Scholar

 

Transmission electron microscopy study of Ge implanted into SiC

Title data

Gorelik, Tatiana ; Kaiser, Ute ; Schubert, Christian ; Wesch, Werner ; Glatzel, Uwe:
Transmission electron microscopy study of Ge implanted into SiC.
In: Journal of Materials Research. Vol. 17 (2002) Issue 2 . - pp. 479-486.
ISSN 2044-5326
DOI: https://doi.org/10.1557/JMR.2002.0067

Further data

Item Type: Article in a journal
Refereed: Yes
Keywords: Compound semiconductors; Microstructure; Ion implantation
Institutions of the University: Faculties
Faculties > Faculty of Engineering Science
Faculties > Faculty of Engineering Science > Chair Metals and Alloys
Faculties > Faculty of Engineering Science > Chair Metals and Alloys > Chair Metals and Alloys - Univ.-Prof. Dr.-Ing. Uwe Glatzel
Profile Fields
Profile Fields > Advanced Fields
Profile Fields > Advanced Fields > Advanced Materials
Research Institutions
Research Institutions > Research Centres
Research Institutions > Research Centres > Bayreuth Center for Material Science and Engineering - BayMAT
Result of work at the UBT: No
DDC Subjects: 600 Technology, medicine, applied sciences
600 Technology, medicine, applied sciences > 620 Engineering
Date Deposited: 09 Oct 2015 08:54
Last Modified: 24 Jan 2018 09:06
URI: https://eref.uni-bayreuth.de/id/eprint/5194