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Micro-focus X-ray scanning on layers of smectic superstructures

Title data

Gurke, I. ; Wutz, C. ; Gieseler, D. ; Janssens, B. ; Heidelbach, Florian ; Riekel, C. ; Kricheldorf, H. R.:
Micro-focus X-ray scanning on layers of smectic superstructures.
In: Journal of Applied Crystallography. Vol. 33 (2000) Issue 3 . - pp. 718-722.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889899013230

Further data

Item Type: Article in a journal
Refereed: Yes
Institutions of the University: Research Institutions > Research Centres > Bavarian Research Institute of Experimental Geochemistry and Geophysics - BGI
Result of work at the UBT: No
DDC Subjects: 500 Science > 550 Earth sciences, geology
Date Deposited: 04 Nov 2020 07:31
Last Modified: 04 Nov 2020 07:31
URI: https://eref.uni-bayreuth.de/id/eprint/59111