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Microscopic Heterogeneities in the Electrical Properties of SiC as Studied with Single-Molecule Spectroscopy

Title data

Bauer, M. ; Kador, Lothar:
Microscopic Heterogeneities in the Electrical Properties of SiC as Studied with Single-Molecule Spectroscopy.
In: The Journal of Physical Chemistry B. Vol. 107 (2003) Issue 51 . - pp. 14301-14305.
ISSN 1520-5207
DOI: https://doi.org/10.1021/jp0364405

Official URL: Volltext

Abstract in another language

We report on electric-field-tuning experiments of single chromophores in a transparent matrix on top of a microcrystalline layer of silicon carbide (SiC). Upon changes of the electric field strength, most single-molecule lines show a slow creeping behavior toward a new equilibrium position. We attribute the relaxations to slow charge rearrangements in the SiC on a (sub)microscopic scale. This interpretation is supported by atomic force and scanning electron microscopy images of the SiC surface, which show mosaic structures with a typical grain size of about 300 nm.

Further data

Item Type: Article in a journal
Refereed: Yes
Institutions of the University: Faculties
Faculties > Faculty of Mathematics, Physics und Computer Science
Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics
Research Institutions > Research Centres > Bayreuth Institute of Macromolecular Research - BIMF
Research Institutions
Research Institutions > Research Centres
Result of work at the UBT: Yes
DDC Subjects: 500 Science
500 Science > 500 Natural sciences
500 Science > 530 Physics
Date Deposited: 30 Mar 2015 08:23
Last Modified: 18 Feb 2016 08:30
URI: https://eref.uni-bayreuth.de/id/eprint/8694