Titelangaben
Dinnebier, Robert E. ; Bernatowicz, Piotr ; Helluy, Xavier ; Sebald, Angelika ; Wunschel, Markus ; Fitch, Andy ; van Smaalen, Sander:
Structure of compounds E(SnMe3)4 (E = Si, Ge) as seen by high-resolution X-ray powder diffraction and solid-state NMR.
In: Acta Crystallographica Section B.
Bd. 58
(2002)
Heft 1
.
- S. 52-61.
ISSN 2052-5206
DOI: https://doi.org/10.1107/S0108768101016688
Abstract
The compounds tetrakis(trimethylstannyl)germane, Ge(SnMe3)4 (1), and tetrakis(trimethylstannyl)silane, Si(SnMe3)4 (2), have crystal structures with the quasispherical molecules in a closed-packed stacking. At room temperature both structures have the space group P\bar 1 (Z = 2) with a = 9.94457 (5), b = 14.52927 (8), c = 9.16021 (5) Å, [alpha] = 90.53390 (30), [beta] = 111.73080 (30), [gamma] = 90.0049 (4)°, and V = 1229.414 (12) Å3 for (1) and a = 9.92009 (7), b = 14.51029 (11), c = 9.13585 (7) Å, [alpha] = 90.4769 (4), [beta] = 111.6724 (4), [gamma] = 89.9877 (6)°, and V = 1222.037 (16) Å3 for (2). The molecules are found to be ordered as a result of steric interactions between neighboring molecules, as shown by analyzing the distances between the atoms. Upon heating, both compounds undergo a first-order phase transition at temperatures Tc = 348 ± 5 K, as characterized by a relative jump of the lattice parameter of ~16%. At 353 K, both structures have the space group P\bar 1 (Z = 4), with a = 14.2037 (2) Å, and V = 2865.52 (7) Å3 for (1) and a = 14.1346 (2) Å, and V = 2823.90 (7) Å3 for (2). Rietveld refinements were performed for the low-temperature phases measured at T = 295 K [Rwp = 0.0844 for (1), Rwp = 0.0940 for (2)] and for the high-temperature phases measured at T = 353 K [Rwp = 0.0891 for (1), Rwp = 0.0542 for (2)]. The combination of high-resolution X-ray powder diffraction measurements and variable-temperature magic-angle-spinning 13C, 29Si and 119Sn NMR experiments demonstrates low crystallographic and molecular (C1) symmetries for the low-temperature phases of (1) and (2) at temperatures T < 348 ± 5 K and high crystallographic symmetry due to rotational disorder for the high-temperature phases at temperatures T > 348 ± 5 K.
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Publikationsform: | Artikel in einer Zeitschrift |
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Begutachteter Beitrag: | Ja |
Keywords: | High-resolution X-ray powder diffraction; MAS NMR; symmetry; simulated annealing; tetrakis(trimethylstannyl)germane; tetrakis(trimethylstannyl)silane |
Institutionen der Universität: | Fakultäten > Fakultät für Mathematik, Physik und Informatik > Fachgruppe Materialwissenschaften > Lehrstuhl Kristallographie Fakultäten > Fakultät für Mathematik, Physik und Informatik > Fachgruppe Materialwissenschaften > Lehrstuhl Kristallographie > Lehrstuhl Kristallographie - Univ.-Prof. Dr. Sander van Smaalen Fakultäten Fakultäten > Fakultät für Mathematik, Physik und Informatik Fakultäten > Fakultät für Mathematik, Physik und Informatik > Fachgruppe Materialwissenschaften |
Titel an der UBT entstanden: | Ja |
Themengebiete aus DDC: | 500 Naturwissenschaften und Mathematik > 530 Physik |
Eingestellt am: | 21 Mär 2016 11:28 |
Letzte Änderung: | 20 Okt 2023 08:36 |
URI: | https://eref.uni-bayreuth.de/id/eprint/31933 |