Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution

Titelangaben

Pompe, Tilo ; Fery, Andreas ; Herminghaus, Stephan:
Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution.
In: Journal of Adhesion Science and Technology. Bd. 13 (1999) Heft 10 . - S. 1155-1164.
ISSN 1568-5616
DOI: https://doi.org/10.1163/156856199X00848

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Abstract

Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Using Substrates with an artificially patterned wettability, characteristic features in the three-phase contact line were induced, which allow the contact line tension to be determined. The values in the range of -1 x 10-10 N obtained for sessile droplets of hexaethylene glycol arc consistent with theoretical predictions.