Titelangaben
van Oijen, Antoine M. ; Köhler, Jürgen ; Schmidt, Jan ; Müller, M. ; Brakenhoff, G. J.:
Far-field fluorescence microscopy beyond the diffraction limit.
In: Journal of the Optical Society of America A.
Bd. 16
(1999)
Heft 4
.
- S. 909-915.
ISSN 1520-8532
DOI: https://doi.org/10.1364/JOSAA.16.000909
Abstract
A technique has been developed to obtain three-dimensional structural information on a length scale well below the Rayleigh length with conventional far-field optics. By spectrally selecting a single molecule with high-resolution laser spectroscopy and using a CCD camera to register the spatial distribution of the emitted photons in three dimensions, one can determine the position of a molecule with unprecedented accuracy. One can resolve details in the specimen with sub-diffraction-limited resolution in three dimensions by applying this procedure to as many molecules as are present in the same diffraction-limited volume and obtaining their mutual positions. The feasibility of this technique is demonstrated for the system of pentacene in p-terphenyl at cryogenic temperatures for which molecules were localized with an accuracy of better than 40 nm in the lateral and 100 nm in the axial directions.
Weitere Angaben
Publikationsform: | Artikel in einer Zeitschrift |
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Begutachteter Beitrag: | Ja |
Keywords: | organic compounds |
Institutionen der Universität: | Fakultäten > Fakultät für Mathematik, Physik und Informatik > Physikalisches Institut > Lehrstuhl Experimentalphysik IX - Spektroskopie weicher Materie > Lehrstuhl Experimentalphysik IX - Spektroskopie weicher Materie - Univ.-Prof. Dr. Jürgen Köhler Fakultäten Fakultäten > Fakultät für Mathematik, Physik und Informatik Fakultäten > Fakultät für Mathematik, Physik und Informatik > Physikalisches Institut Fakultäten > Fakultät für Mathematik, Physik und Informatik > Physikalisches Institut > Lehrstuhl Experimentalphysik IX - Spektroskopie weicher Materie |
Titel an der UBT entstanden: | Nein |
Themengebiete aus DDC: | 500 Naturwissenschaften und Mathematik > 530 Physik |
Eingestellt am: | 11 Apr 2018 11:30 |
Letzte Änderung: | 16 Apr 2018 09:40 |
URI: | https://eref.uni-bayreuth.de/id/eprint/43415 |