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Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRAIII

Title data

Glazyrin, Konstantin ; Khandarkhaeva, Saiana ; Fedotenko, Timofey ; Dong, W. ; Laniel, Dominique ; Seiboth, Frank ; Schropp, Andreas ; Garrevoet, Jan ; Brückner, Dennis ; Falkenberg, Gerald ; Kubec, Adam ; David, Christian ; Wendt, Mario ; Wenz, Sergej ; Dubrovinsky, Leonid ; Dubrovinskaia, Natalia ; Liermann, Hanns-Peter:
Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRAIII.
In: Journal of Synchrotron Radiation. Vol. 29 (2022) Issue 3 . - pp. 654-663.
ISSN 1600-5775
DOI: https://doi.org/10.1107/S1600577522002582

Official URL: Volltext

Abstract in another language

Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X-ray diffraction instrumentation in terms of X-ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline (P02.2, PETRAIII, DESY, Germany) that enable considerable improvements in data collection at very high pressures and small scattering volumes. In particular, the focusing of the X-ray beam to the sub-micrometer level is described, and control of the aberrations of the focusing compound refractive lenses is made possible with the implementation of a correcting phase plate. This device provides a significant enhancement of the signal-to-noise ratio by conditioning the beam shape profile at the focal spot. A new sample alignment system with a small sphere of confusion enables single-crystal data collection from grains of micrometer to sub-micrometer dimensions subjected to pressures as high as 200GPa. The combination of the technical development of the optical path and the sample alignment system contributes to research and gives benefits on various levels, including rapid and accurate diffraction mapping of samples with sub-micrometer resolution at multimegabar pressures.

Further data

Item Type: Article in a journal
Refereed: Yes
Keywords: high pressure; diamond anvil cells; X-ray diffraction; phase correcting plate; sub-micrometer focusing
Institutions of the University: Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Chair Crystallography
Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Professor Materials Physics and Technology at Extreme Conditions
Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Professor Materials Physics and Technology at Extreme Conditions > Professor Materials Physics and Technology at Extreme Conditions - Univ.-Prof. Dr. Natalia Doubrovinckaia
Result of work at the UBT: Yes
DDC Subjects: 500 Science > 530 Physics
Date Deposited: 16 Sep 2022 07:09
Last Modified: 16 Sep 2022 07:09
URI: https://eref.uni-bayreuth.de/id/eprint/71848