Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging

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Nellist, Michael R. ; Chen, Yikai ; Mark, Andreas ; Gödrich, Sebastian ; Stelling, Christian ; Jiang, Jingjing ; Poddar, Rakesh ; Li, Chunzeng ; Kumar, Ravi ; Papastavrou, Georg ; Retsch, Markus ; Brunschwig, Bruce S. ; Huang, Zhuangqun ; Xiang, Chengxiang ; Boettcher, Shannon W.:
Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging.
In: Nanotechnology. Vol. 28 (2017) Issue 9 . - 095711.
ISSN 1361-6528
DOI: https://doi.org/10.1088/1361-6528/aa5839