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Far-field fluorescence microscopy beyond the diffraction limit

Title data

van Oijen, Antoine M. ; Köhler, Jürgen ; Schmidt, Jan ; Müller, M. ; Brakenhoff, G. J.:
Far-field fluorescence microscopy beyond the diffraction limit.
In: Journal of the Optical Society of America A. Vol. 16 (1999) Issue 4 . - pp. 909-915.
ISSN 1520-8532
DOI: https://doi.org/10.1364/JOSAA.16.000909

Abstract in another language

A technique has been developed to obtain three-dimensional structural information on a length scale well below the Rayleigh length with conventional far-field optics. By spectrally selecting a single molecule with high-resolution laser spectroscopy and using a CCD camera to register the spatial distribution of the emitted photons in three dimensions, one can determine the position of a molecule with unprecedented accuracy. One can resolve details in the specimen with sub-diffraction-limited resolution in three dimensions by applying this procedure to as many molecules as are present in the same diffraction-limited volume and obtaining their mutual positions. The feasibility of this technique is demonstrated for the system of pentacene in p-terphenyl at cryogenic temperatures for which molecules were localized with an accuracy of better than 40 nm in the lateral and 100 nm in the axial directions.

Further data

Item Type: Article in a journal
Refereed: Yes
Keywords: organic compounds
Institutions of the University: Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics > Chair Experimental Physics IX - Spectroscopy of Soft Matter > Chair Experimental Physics IX - Spectroscopy of Soft Matter - Univ.-Prof. Dr. Jürgen Köhler
Faculties
Faculties > Faculty of Mathematics, Physics und Computer Science
Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics
Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics > Chair Experimental Physics IX - Spectroscopy of Soft Matter
Result of work at the UBT: No
DDC Subjects: 500 Science > 530 Physics
Date Deposited: 11 Apr 2018 11:30
Last Modified: 16 Apr 2018 09:40
URI: https://eref.uni-bayreuth.de/id/eprint/43415