at Google ScholarTitle data
Glazyrin, Konstantin ; Khandarkhaeva, Saiana ; Fedotenko, Timofey ; Dong, W. ; Laniel, Dominique ; Seiboth, Frank ; Schropp, Andreas ; Garrevoet, Jan ; Brückner, Dennis ; Falkenberg, Gerald ; Kubec, Adam ; David, Christian ; Wendt, Mario ; Wenz, Sergej ; Dubrovinsky, Leonid ; Dubrovinskaia, Natalia ; Liermann, Hanns-Peter:
Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRAIII.
In: Journal of Synchrotron Radiation.
Vol. 29
(2022)
Issue 3
.
- pp. 654-663.
ISSN 1600-5775
DOI: https://doi.org/10.1107/S1600577522002582
Abstract in another language
Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X-ray diffraction instrumentation in terms of X-ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline (P02.2, PETRAIII, DESY, Germany) that enable considerable improvements in data collection at very high pressures and small scattering volumes. In particular, the focusing of the X-ray beam to the sub-micrometer level is described, and control of the aberrations of the focusing compound refractive lenses is made possible with the implementation of a correcting phase plate. This device provides a significant enhancement of the signal-to-noise ratio by conditioning the beam shape profile at the focal spot. A new sample alignment system with a small sphere of confusion enables single-crystal data collection from grains of micrometer to sub-micrometer dimensions subjected to pressures as high as 200GPa. The combination of the technical development of the optical path and the sample alignment system contributes to research and gives benefits on various levels, including rapid and accurate diffraction mapping of samples with sub-micrometer resolution at multimegabar pressures.