Zeitschrift: European Journal of Plant Pathology

2011

ElSayed, Abdelaleim Ismail ; Weig, Alfons ; Komor, Ewald:
Molecular characterization of Hawaiian Sugarcane yellow leaf virus genotypes and their phylogenetic relationship to strains from other sugarcane-growing countries.
In: European Journal of Plant Pathology. Bd. 129 (2011) Heft 3 . - S. 399-412.
ISSN 1573-8469
DOI: https://doi.org/10.1007/s10658-010-9703-0

Komor, Ewald:
Susceptibility of sugarcane, plantation weeds and grain cereals to infection by Sugarcane yellow leaf virus and selection by sugarcane breeding in Hawaii.
In: European Journal of Plant Pathology. Bd. 129 (2011) Heft 3 . - S. 379-388.
ISSN 1573-8469
DOI: https://doi.org/10.1007/s10658-010-9701-2

2010

Zhu, Yun J. ; Lim, Steven T. S. ; Schenck, Susan ; Arcinas, Albert ; Komor, Ewald:
RT-PCR and quantitative real-time RT-PCR detection of Sugarcane Yellow Leaf Virus (SCYLV) in symptomatic and asymptomatic plants of Hawaiian sugarcane cultivars and the correlation of SCYLV titre to yield.
In: European Journal of Plant Pathology. Bd. 127 (2010) Heft 2 . - S. 263-273.
ISSN 1573-8469
DOI: https://doi.org/10.1007/s10658-010-9591-3

Komor, Ewald ; ElSayed, Abdelaleim Ismail ; Lehrer, Axel T.:
Sugarcane yellow leaf virus introduction and spread in Hawaiian sugarcane industry : Retrospective epidemiological study of an unnoticed, mostly asymptomatic plant disease.
In: European Journal of Plant Pathology. Bd. 127 (2010) Heft 2 . - S. 207-217.
ISSN 1573-8469
DOI: https://doi.org/10.1007/s10658-010-9585-1