Zeitschrift: Journal of Applied Crystallography

2023

Goonetilleke, Damian ; Suard, Emmanuelle ; Bergner, Benjamin ; Janek, Jürgen ; Brezesinski, Torsten ; Bianchini, Matteo:
In situ neutron diffraction to investigate the solid-state synthesis of Ni-rich cathode materials.
In: Journal of Applied Crystallography. Bd. 56 (2023) Heft 4 . - S. 1066-1075.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S1600576723004909

2022

Aslandukov, Andrii ; Aslandukov, Matvii ; Dubrovinskaia, Natalia ; Dubrovinsky, Leonid:
Domain Auto Finder (DAFi) program : the analysis of single-crystal X-ray diffraction data from polycrystalline samples.
In: Journal of Applied Crystallography. Bd. 55 (2022) Heft 5 . - S. 1383-1391.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S1600576722008081

2019

Krauß, Sebastian W. ; Schweins, Ralf ; Magerl, Andreas ; Zobel, Mirijam:
Free-film small-angle neutron scattering : a novel container-free in situ sample environment with minimized H/D exchange.
In: Journal of Applied Crystallography. Bd. 52 (2019) Heft 2 . - S. 284-288.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S1600576719000906

2017

Hübschle, Christian B. ; van Smaalen, Sander:
Electrostatic potential of dynamic charge densities.
In: Journal of Applied Crystallography. Bd. 50 (2017) Heft 6 . - S. 1627-1636.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S1600576717013802

2015

Kallistová, A. ; Skála, R. ; Horácek, Ivan ; Miyajima, Nobuyoshi ; Malíková, R.:
Influence of sample preparation on the microstructure of tooth enamel apatite.
In: Journal of Applied Crystallography. Bd. 48 (2015) Heft 3 . - S. 763-768.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S1600576715005208

2014

Sarkar, Kuhu ; Rawolle, Monika ; Niedermeier, Martin A. ; Wang, Weijia ; Herzig, Eva M. ; Körstgens, Volker ; Buffet, Adeline ; Roth, Stephan V. ; Müller-Buschbaum, Peter:
A quantitative approach to tune metal oxide network morphology based on grazing-incidence small-angle X-ray scattering investigations.
In: Journal of Applied Crystallography. Bd. 47 (2014) Heft 1 . - S. 76-83.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S1600576713027775

2012

Palatinus, Lukas ; Prathapa, Siriyara Jagannatha ; van Smaalen, Sander:
EDMA : a computer program for topological analysis of discrete electron densities.
In: Journal of Applied Crystallography. Bd. 45 (2012) Heft 3 . - S. 575-580.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889812016068

2003

Dingenouts, N. ; Rosenfeldt, Sabine ; Werner, Nicole ; Vögtle, F. ; Lindner, Peter ; Roulamo, A. ; Rissanen, K. ; Ballauff, Matthias:
Segmental contrast of dendrimers : a small‐angle neutron scattering study including contrast variation.
In: Journal of Applied Crystallography. Bd. 36 (2003) . - S. 674-678.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889803000621

2002

Pilz, Katrin ; Estermann, Michael ; van Smaalen, Sander:
Automatic indexing of area-detector data of periodic and aperiodic crystals.
In: Journal of Applied Crystallography. Bd. 35 (2002) Heft 2 . - S. 253-260.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889802001838

2001

Dusek, Michal ; Wunschel, Markus ; Dinnebier, Robert E. ; van Smaalen, Sander:
Refinement of modulated structures against X-ray powder diffraction data with JANA2000.
In: Journal of Applied Crystallography. Bd. 34 (2001) Heft 3 . - S. 398-404.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889801003302

2000

Seelenmeyer, S. ; Deike, I. ; Dingenouts, Nico ; Rosenfeldt, Sabine ; Norhausen, Ch. ; Ballauff, Matthias ; Narayanan, Theyencheri:
Analysis of the Volume Transition in Thermosensitive Core-Shell Particles by synchrotron Small-Angle X-Ray Scattering.
In: Journal of Applied Crystallography. Bd. 33 (2000) . - S. 574-576.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889899013163

Dinnebier, Robert E. ; Schweiger, Manuela ; Bildstein, Benno ; Shankland, Kenneth ; David, William I. F. ; Jobst, Andreas ; van Smaalen, Sander:
The disordered structure of tetraferrocenyl-3-cumulene, (Fc)₂C=C=C=C(Fc)₂, by simulated annealing using synchrotron powder diffraction data.
In: Journal of Applied Crystallography. Bd. 33 (2000) Heft 5 . - S. 1199-1207.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889800007470

Gurke, I. ; Wutz, C. ; Gieseler, D. ; Janssens, B. ; Heidelbach, Florian ; Riekel, C. ; Kricheldorf, H. R.:
Micro-focus X-ray scanning on layers of smectic superstructures.
In: Journal of Applied Crystallography. Bd. 33 (2000) Heft 3 . - S. 718-722.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889899013230

1999

Schmidt, Martin U. ; Dinnebier, Robert E.:
Combination of energy minimizations and rigid-body Rietveld refinement : the structure of 2,5-dihydroxybenzo[de]benzo[4,5]imidazo[2,1-a]isoquinolin-7-one.
In: Journal of Applied Crystallography. Bd. 32 (1999) Heft 2 . - S. 178-186.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889898011157

Heidelbach, Florian ; Riekel, C. ; Wenk, H.-R.:
Quantitative texture analysis of small domains with synchrotron radiation X-rays.
In: Journal of Applied Crystallography. Bd. 32 (1999) Heft 5 . - S. 841-849.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889899004999

Dinnebier, Robert E. ; von Dreele, R. ; Stephens, Peter W. ; Jelonek, S. ; Sieler, J.:
Structure of sodium para-hydroxybenzoate, NaO₂C-C₆H₄OH by powder diffraction : application of a phenomenological model of anisotropic peak width.
In: Journal of Applied Crystallography. Bd. 32 (1999) Heft 4 . - S. 761-769.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889899005233