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Long term stability of a modern powder diffractometer

Title data

Wunschel, Markus ; Dinnebier, Robert E. ; van Smaalen, Sander:
Long term stability of a modern powder diffractometer.
In: Powder Diffraction. Vol. 16 (2001) Issue 3 . - pp. 149-152.
ISSN 1945-7413
DOI: https://doi.org/10.1154/1.1313242

Official URL: Volltext

Abstract in another language

ABSTRACT The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.

Further data

Item Type: Article in a journal
Refereed: Yes
Institutions of the University: Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Chair Crystallography
Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Chair Crystallography > Chair Crystallography - Univ.-Prof. Dr. Sander van Smaalen
Faculties
Faculties > Faculty of Mathematics, Physics und Computer Science
Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences
Result of work at the UBT: Yes
DDC Subjects: 500 Science > 530 Physics
Date Deposited: 22 Mar 2016 08:00
Last Modified: 22 Mar 2016 08:00
URI: https://eref.uni-bayreuth.de/id/eprint/31963