Long term stability of a modern powder diffractometer

Titelangaben

Wunschel, Markus ; Dinnebier, Robert E. ; van Smaalen, Sander:
Long term stability of a modern powder diffractometer.
In: Powder Diffraction. Bd. 16 (2001) Heft 3 . - S. 149-152.
ISSN 1945-7413
DOI: https://doi.org/10.1154/1.1313242

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Abstract

ABSTRACT The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.