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Short Circuit Robustness Analysis of Modern SiC Power Semiconductors and Preinvestigation of Different Short Circuit Detection Methods

Title data

Griffioen, Pieter:
Short Circuit Robustness Analysis of Modern SiC Power Semiconductors and Preinvestigation of Different Short Circuit Detection Methods.
2015
( Bachelor thesis, 2015 , Universität Bayreuth, Fakultät für Ingenieurwissenschaften, Lehrstuhl für Mechatronik)

Further data

Item Type: Bachelor thesis
Institutions of the University: Faculties > Faculty of Engineering Science > Chair Mechatronics
Faculties
Faculties > Faculty of Engineering Science
Result of work at the UBT: Yes
DDC Subjects: 600 Technology, medicine, applied sciences > 620 Engineering
Date Deposited: 01 Aug 2017 10:40
Last Modified: 01 Aug 2017 10:40
URI: https://eref.uni-bayreuth.de/id/eprint/38997