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Hain, Stefan ; Bakran, Mark-M.:
Suitable Turn-Off Strategies for IGBTs with High Desaturation Current During Short Circuit Failures Detected with the 2D-Short Circuit Detection Method.
2017
Veranstaltung: PCIM Europe 2017
, 16.-18.05.2017
, Nürnberg, Deutschland.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung
,
Paper
)
Abstract
The 2D-short circuit detection method is one of the fastest fault detection methods for power semicon-ductors. It is able to detect a short circuit failure even before the collector current reaches its desaturaion limit. But a fast fault detection is just one part of a reliable short circuit protection. It has to be combined with a fast reacting and sutiable turn-off strategy in order to provide a working short circuit protection. Therefore, this paper presents the suitability of different turn-off strategies for short circuit events for IGBTs with a high desturation current, detected with the 2D-short circuit detection method.
Weitere Angaben
| Publikationsform: | Veranstaltungsbeitrag (Paper) |
|---|---|
| Begutachteter Beitrag: | Ja |
| Institutionen der Universität: | Fakultäten > Fakultät für Ingenieurwissenschaften > Lehrstuhl Mechatronik Fakultäten Fakultäten > Fakultät für Ingenieurwissenschaften |
| Titel an der UBT entstanden: | Ja |
| Themengebiete aus DDC: | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften |
| Eingestellt am: | 26 Sep 2017 06:15 |
| Letzte Änderung: | 09 Jan 2023 12:20 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/39745 |