X-ray powder diffraction studies at non-ambient conditions on the compounds In x Nb 3 Te 4 (x = 0,0.54) and Si[C(CH 3) 3] n[Si(CH 3) 3] 4-n (n = 0,1,2)

Titelangaben

Wunschel, Markus:
X-ray powder diffraction studies at non-ambient conditions on the compounds In x Nb 3 Te 4 (x = 0,0.54) and Si[C(CH 3) 3] n[Si(CH 3) 3] 4-n (n = 0,1,2).
2003 . - VI, 173 S.
( Dissertation, 2003 , Universität Bayreuth, Fakultät für Mathematik und Physik)