at Google ScholarTitle data
Wunschel, Markus ; Dinnebier, Robert E. ; van Smaalen, Sander:
Long term stability of a modern powder diffractometer.
In: Powder Diffraction.
Vol. 16
(2001)
Issue 3
.
- pp. 149-152.
ISSN 1945-7413
DOI: https://doi.org/10.1154/1.1313242
Abstract in another language
ABSTRACT The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.
Further data
| Item Type: | Article in a journal |
|---|---|
| Refereed: | Yes |
| Institutions of the University: | Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Chair Crystallography Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences > Chair Crystallography > Chair Crystallography - Univ.-Prof. Dr. Sander van Smaalen Faculties Faculties > Faculty of Mathematics, Physics und Computer Science Faculties > Faculty of Mathematics, Physics und Computer Science > Group Material Sciences |
| Result of work at the UBT: | Yes |
| DDC Subjects: | 500 Science > 530 Physics |
| Date Deposited: | 22 Mar 2016 08:00 |
| Last Modified: | 22 Mar 2016 08:00 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/31963 |