at Google ScholarTitle data
Sander, D. ; Enders, Axel ; Kirschner, J.:
A simple technique to measure stress in ultrathin films during growth.
In: Review of Scientific Instruments.
Vol. 66
(1995)
Issue 9
.
- pp. 4734-4735.
ISSN 1089-7623
DOI: https://doi.org/10.1063/1.1145316
Further data
| Item Type: | Article in a journal |
|---|---|
| Refereed: | Yes |
| Institutions of the University: | Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics > Chair Experimental Physics XI - Functional Nanostructures > Chair Experimental Physics XI - Functional Nanostructures - Univ.-Prof. Dr. Axel Enders Faculties Faculties > Faculty of Mathematics, Physics und Computer Science Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics Faculties > Faculty of Mathematics, Physics und Computer Science > Department of Physics > Chair Experimental Physics XI - Functional Nanostructures |
| Result of work at the UBT: | No |
| DDC Subjects: | 500 Science > 500 Natural sciences 500 Science > 530 Physics 500 Science > 540 Chemistry |
| Date Deposited: | 06 Dec 2016 08:34 |
| Last Modified: | 06 Dec 2016 08:34 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/35241 |