Titelangaben
Huang, Zhuangqun ; de Wolf, Peter ; Poddar, Rakesh ; Li, Chunzeng ; Mark, Andreas ; Nellist, Michael R. ; Chen, Yikai ; Jiang, Jingjing ; Papastavrou, Georg ; Boettcher, Shannon W. ; Xiang, Chengxiang ; Brunschwig, Bruce S.:
PeakForce Scanning Electrochemical Microscopy with Nanoelectrode Probes.
In: Microscopy Today.
Bd. 24
(2016)
Heft 06
.
- S. 18-25.
ISSN 2150-3583
DOI: https://doi.org/10.1017/S1551929516000882