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Rohloff, Martin ; Cosgun, Sevilay ; Massué, Cyriac ; Lunkenbein, Thomas ; Senyshyn, Anatoliy ; Lerch, Martin ; Fischer, Anna ; Behrens, Malte:
The role of synthesis conditions for structural defects and lattice strain in β-TaON and their effect on photo- and photoelectrocatalysis.
In: Zeitschrift für Naturforschung B.
Bd. 74
(2019)
Heft 1
.
- S. 71-83.
ISSN 1865-7117
DOI: https://doi.org/10.1515/znb-2018-0171
Abstract
The importance of the synthesis conditions on the structural and photocatalytic properties of tantalum oxide nitride was investigated by comparing two variants of phase-pure beta-TaON obtained from application of two different synthesis routes, leading to one unstrained and one heavily anisotropically microstrained beta-TaON as shown by XRD-based Rietveld refinement. HRTEM images reveal the origin of the strain to be lattice defects such as stacking faults. The strained beta-TaON was found to be the clearly less active semiconductor in photochemical and photoelectrochemical water oxidation. The lattice defects are assumed to act as charge carrier traps hindering the photo-generated holes to be displaced to the reaction sites at the surface.