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Quantitative texture analysis of small domains with synchrotron radiation X-rays

Title data

Heidelbach, Florian ; Riekel, C. ; Wenk, H.-R.:
Quantitative texture analysis of small domains with synchrotron radiation X-rays.
In: Journal of Applied Crystallography. Vol. 32 (1999) Issue 5 . - pp. 841-849.
ISSN 1600-5767
DOI: https://doi.org/10.1107/S0021889899004999

Further data

Item Type: Article in a journal
Refereed: Yes
Institutions of the University: Research Institutions > Research Centres > Bavarian Research Institute of Experimental Geochemistry and Geophysics - BGI
Result of work at the UBT: No
DDC Subjects: 500 Science > 550 Earth sciences, geology
Date Deposited: 04 Nov 2020 07:26
Last Modified: 04 Nov 2020 07:26
URI: https://eref.uni-bayreuth.de/id/eprint/58884