bei Google ScholarTitelangaben
Gleißner, Michael ; Bakran, Mark-M.:
Detection of Degradation with Junction Temperature Monitor and Extended Kalman Filter during Operation of Converters.
2025
Veranstaltung: 10th IEEE Southern Power Electronics Conference (SPEC 2025)
, 01.12.-04.12.2025
, Johannesburg, Südafrika.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung
,
Paper
)
Abstract
The junction temperature monitor, based on the
internal gate resistance as temperature sensitive electrical parameter,
enables the measurement of the semiconductor temperature
during normal converter operation. The measured temperature
signal and the model-based operating point-dependent power
dissipation are used as input variables for an extended Kalman
filter, which estimates the thermal resistances of a multistage,
one-dimensional network model. The network model is based
on different time constants that correspond to either near-chip
or near-cooling system layers in the thermal model. Utilizing
simulations and hardware measurements on an IGBT inverter, it
has been demonstrated that the extended Kalman filter possesses
the capability to identify the location at which a degradation of
the thermal resistance has occurred within the cooling path.
Weitere Angaben
| Publikationsform: | Veranstaltungsbeitrag (Paper) |
|---|---|
| Begutachteter Beitrag: | Ja |
| Institutionen der Universität: | Fakultäten > Fakultät für Ingenieurwissenschaften > Lehrstuhl Mechatronik > Lehrstuhl Mechatronik - Univ.-Prof. Dr.-Ing. Mark-M. Bakran Profilfelder > Advanced Fields > Neue Materialien Profilfelder > Emerging Fields > Energieforschung und Energietechnologie Forschungseinrichtungen > Forschungsstellen > Zentrum für Energietechnik - ZET |
| Titel an der UBT entstanden: | Ja |
| Themengebiete aus DDC: | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften |
| Eingestellt am: | 29 Jan 2026 07:50 |
| Letzte Änderung: | 29 Jan 2026 07:50 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/95901 |