Titelangaben
Rieg, Frank ; Koch, Frank:
Reliable Application of FEA by Designers.
In:
National Agency for Finite Element Methos and Standards
(Hrsg.):
Validation of FEM Analysis : Models and Results ; seminar, 13th - 14th November 2002, Wiesbaden, Germany. -
Grafing
: NAFEMS Kontakt DACH
,
2002
Abstract
Today there is already a trend in the use of FEA towards performing less complex and repeating analyses by the designers themselves and leaving the more complex and difficult ones to the analysis specialists. This will cause shortened iteration cycles during the product development process. To ensure the accuracy and the efficiency of FE analyses the designer's support must be improved. This paper proposes a method for this improvement.
At first, characteristic design parts are classified by well defined attributes. FEA procedures are assigned to these part classes. The assignment is verified by computational tests and parametric analyses with a computer algebra system. The assignment is offered as a design catalogue to make it easy to use for the designer. An example illustrates the application of the proposed method.
The verification is restricted to static analyses and the selection of the element type
Weitere Angaben
Publikationsform: | Aufsatz in einem Buch |
---|---|
Begutachteter Beitrag: | Ja |
Keywords: | FEA; 3D finite element; bending; shearM; CAD; shape functions |
Institutionen der Universität: | Fakultäten > Fakultät für Ingenieurwissenschaften > Lehrstuhl Konstruktionslehre/CAD Fakultäten > Fakultät für Ingenieurwissenschaften > Ehemalige Professoren > Lehrstuhl Konstruktionslehre/CAD - Univ.-Prof. Dr.-Ing. Frank Rieg Fakultäten Fakultäten > Fakultät für Ingenieurwissenschaften Fakultäten > Fakultät für Ingenieurwissenschaften > Ehemalige Professoren |
Titel an der UBT entstanden: | Ja |
Themengebiete aus DDC: | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften |
Eingestellt am: | 16 Nov 2015 09:28 |
Letzte Änderung: | 16 Nov 2015 09:28 |
URI: | https://eref.uni-bayreuth.de/id/eprint/22579 |