at Google ScholarTitle data
Horff, Roman ; Bertelshofer, Teresa ; März, Andreas ; Bakran, Mark-M.:
Current Measurement and Gate-Resistance Mismatch in Paralleled Phases of High Power SiC MOSFET Modules.
2016
Event: PCIM Europe 2016
, 10.-12.05.2016
, Nürnberg.
(Conference item: Conference
,
Poster
)
Abstract in another language
This paper deals with the problems of current measurement in paralleled phases. A solution based on low inductive shunts is proposed. The influence of gate-resistance mismatch on the switching behaviour and the resulting switching losses are analysed for high power SiC MOSFET modules.
Further data
| Item Type: | Conference item (Poster) |
|---|---|
| Refereed: | Yes |
| Institutions of the University: | Faculties > Faculty of Engineering Science > Chair Mechatronics > Chair Mechatronics - Univ.-Prof. Dr.-Ing. Mark-M. Bakran Profile Fields > Advanced Fields > Advanced Materials Profile Fields > Emerging Fields > Energy Research and Energy Technology Research Institutions > Research Units > ZET - Zentrum für Energietechnik Faculties Faculties > Faculty of Engineering Science Faculties > Faculty of Engineering Science > Chair Mechatronics Profile Fields Profile Fields > Advanced Fields Profile Fields > Emerging Fields Research Institutions Research Institutions > Research Units |
| Result of work at the UBT: | Yes |
| DDC Subjects: | 600 Technology, medicine, applied sciences > 620 Engineering |
| Date Deposited: | 19 May 2016 11:20 |
| Last Modified: | 09 Jan 2023 12:41 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/32407 |