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Kaznatcheev, Konstantin V. ; Karunakaran, Chithra ; Lanke, Uday D. ; Urquhart, Stephen G. ; Obst, Martin ; Hitchcock, Adam P.:
Soft X-ray spectromicroscopy beamline at the CLS : Commissioning results.
In: Nuclear Instruments and Methods in Physics Research Section A : Accelerators, Spectrometers, Detectors and Associated Equipment.
Bd. 582
(2007)
Heft 1
.
- S. 96-99.
ISSN 1872-9576
DOI: https://doi.org/10.1016/j.nima.2007.08.083
Abstract
The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100–2000 eV range and two end stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its design parameters with an on-sample flux of ∼108 ph/s@R=3000, 0.5 A in STXM and ∼1012 ph/s@R=3000, 0.5 A in the PEEM, in each case at a spatial resolution exceeding 40 nm. It can also provide an energy resolving power above 10,000. A careful EPU calibration procedure enables advanced polarization measurements.