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Fischerauer, Gerhard ; Gogl, Dietmar ; Weigel, Robert ; Russer, Peter:
Rigorous modeling of parasitic effects in complex SAW RF filters.
In:
1994 IEEE MTT-S International Microwave Symposium Digest. -
Piscataway, NJ
: IEEE
,
1994
. - S. 1209-1212
ISBN 0-7803-1778-5
DOI: https://doi.org/10.1109/MWSYM.1994.335563
Abstract
This work presents an easy-to-implement and fast lumped-element circuit model for the parasitics of complex low-loss surface acoustic wave (SAW) devices such as interdigitated interdigital transducer (IIDT) and image impedance connected (IIC) filters. The model parameters can be derived from knowledge of the device geometry without recourse to optimization methods. We investigated the influence of the measurement setup, the package and the layout itself. It is shown how the model parameters are determined by either experiment or analysis. The greatly enhanced predictive power of the extended simulation model is demonstrated by applying it to a 15-transducer IIDT filter and a 22-transducer IIC filter at 900 MHz. It was found, for instance, that parasitic capacitances strongly influence the input impedance in the passband while the stopband level is easily explained by the inductive coupling between bond wires.
Weitere Angaben
| Publikationsform: | Aufsatz in einem Buch |
|---|---|
| Begutachteter Beitrag: | Nein |
| Institutionen der Universität: | Fakultäten > Fakultät für Ingenieurwissenschaften > Lehrstuhl Mess- und Regeltechnik > Lehrstuhl Mess- und Regeltechnik - Univ.-Prof. Dr.-Ing. Gerhard Fischerauer |
| Titel an der UBT entstanden: | Nein |
| Themengebiete aus DDC: | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften |
| Eingestellt am: | 24 Jul 2024 11:24 |
| Letzte Änderung: | 24 Jul 2024 11:24 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/90042 |