at Google ScholarTitle data
Gleißner, Michael ; Bakran, Mark-M.:
Detection of Degradation with Junction Temperature Monitor and Extended Kalman Filter during Operation of Converters.
2025
Event: 10th IEEE Southern Power Electronics Conference (SPEC 2025)
, 01.12.-04.12.2025
, Johannesburg, Südafrika.
(Conference item: Conference
,
Paper
)
Abstract in another language
The junction temperature monitor, based on the
internal gate resistance as temperature sensitive electrical parameter,
enables the measurement of the semiconductor temperature
during normal converter operation. The measured temperature
signal and the model-based operating point-dependent power
dissipation are used as input variables for an extended Kalman
filter, which estimates the thermal resistances of a multistage,
one-dimensional network model. The network model is based
on different time constants that correspond to either near-chip
or near-cooling system layers in the thermal model. Utilizing
simulations and hardware measurements on an IGBT inverter, it
has been demonstrated that the extended Kalman filter possesses
the capability to identify the location at which a degradation of
the thermal resistance has occurred within the cooling path.
Further data
| Item Type: | Conference item (Paper) |
|---|---|
| Refereed: | Yes |
| Institutions of the University: | Faculties > Faculty of Engineering Science > Chair Mechatronics > Chair Mechatronics - Univ.-Prof. Dr.-Ing. Mark-M. Bakran Profile Fields > Advanced Fields > Advanced Materials Profile Fields > Emerging Fields > Energy Research and Energy Technology Research Institutions > Research Units > Zentrum für Energietechnik - ZET |
| Result of work at the UBT: | Yes |
| DDC Subjects: | 600 Technology, medicine, applied sciences > 620 Engineering |
| Date Deposited: | 29 Jan 2026 07:50 |
| Last Modified: | 29 Jan 2026 07:50 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/95901 |