Veröffentlichungen "Li, Zheming"

2022

Walter, Michael ; Bakran, Mark-M. ; Maier, Robert ; Li, Zheming:
Hardware Development of an Active Gate Driver to Mitigate Oscillations of SiC MOSFET Switching Process.
2022
Veranstaltung: PCIM Europe 2022 , 10.05.-12.05.2022 , Nürnberg.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )
DOI: https://doi.org/10.30420/565822221

Li, Zheming ; Bakran, Mark-M. ; Maier, Robert ; Walter, Michael:
A Self-Regulating Gate Control based on the Parasitic Turn-On Effect for Low Losses and Low EMI of SiC MOSFET.
2022
Veranstaltung: PCIM Europe 2022 , 10.05.-12.05.2022 , Nürnberg.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )
DOI: https://doi.org/10.30420/565822048

Li, Zheming ; Maier, Robert ; Bakran, Mark-M.:
A Simulation Model for SiC MOSFET Switching Transients Controlled by an Adaptive Gate Driver with the Capability of Reducing Switching Losses and EMI across the Full Operating Range.
2022
Veranstaltung: EPE 2022 ECCE Europe , 05.-09.09.2022 , Hannover.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

2021

Li, Zheming ; Maier, Robert ; Bakran, Mark-M. ; Domes, Daniel ; Niedernostheide, Franz-J.:
How to Turn off SiC MOSFET with Low Losses and Low EMI Across the Full Operating Range.
2021
Veranstaltung: PCIM Europe digital days 2021 , 3-7 May 2021 .
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

Li, Zheming ; Maier, Robert ; Bakran, Mark-M.:
Less Losses with Less Oscillations : How to Achieve This at SiC MOSFET Turn-On across the Full Operating Range.
2021
Veranstaltung: 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe) , 06.-10. Sept. 2021 , Virtual.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

2020

Li, Zheming ; Maier, Robert ; Bakran, Mark-M.:
Mitigating Drain Source Voltage Oscillation with Low Switching Losses for SiC Power MOSFETs Using FPGA-Controlled Active Gate Driver.
In: 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe). - Piscataway, NJ : IEEE , 2020
ISBN 978-90-75815-36-8
DOI: https://doi.org/10.23919/EPE20ECCEEurope43536.2020.9215813