at Google ScholarTitle data
Gorelik, Tatiana ; Kaiser, Ute ; Schubert, Christian ; Wesch, Werner ; Glatzel, Uwe:
Transmission electron microscopy study of Ge implanted into SiC.
In: Journal of Materials Research.
Vol. 17
(2002)
Issue 2
.
- pp. 479-486.
ISSN 2044-5326
DOI: https://doi.org/10.1557/JMR.2002.0067
Further data
| Item Type: | Article in a journal |
|---|---|
| Refereed: | Yes |
| Keywords: | Compound semiconductors; Microstructure; Ion implantation |
| Institutions of the University: | Faculties Faculties > Faculty of Engineering Science Faculties > Faculty of Engineering Science > Chair Metals and Alloys Faculties > Faculty of Engineering Science > Chair Metals and Alloys > Chair Metals and Alloys - Univ.-Prof. Dr.-Ing. Uwe Glatzel Profile Fields Profile Fields > Advanced Fields Profile Fields > Advanced Fields > Advanced Materials Research Institutions Research Institutions > Research Centres Research Institutions > Research Centres > Bayreuth Center for Material Science and Engineering - BayMAT |
| Result of work at the UBT: | No |
| DDC Subjects: | 600 Technology, medicine, applied sciences 600 Technology, medicine, applied sciences > 620 Engineering |
| Date Deposited: | 09 Oct 2015 08:54 |
| Last Modified: | 24 Jan 2018 09:06 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/5194 |