Literature by the same author
plus at Google Scholar

Bibliografische Daten exportieren
 

Transmission electron microscopy study of Ge implanted into SiC

Title data

Gorelik, Tatiana ; Kaiser, Ute ; Schubert, Christian ; Wesch, Werner ; Glatzel, Uwe:
Transmission electron microscopy study of Ge implanted into SiC.
In: Journal of Materials Research. Vol. 17 (2002) Issue 2 . - pp. 479-486.
ISSN 2044-5326
DOI: https://doi.org/10.1557/JMR.2002.0067

Further data

Item Type: Article in a journal
Refereed: Yes
Keywords: Compound semiconductors; Microstructure; Ion implantation
Institutions of the University: Faculties
Faculties > Faculty of Engineering Science
Faculties > Faculty of Engineering Science > Chair Metals and Alloys
Faculties > Faculty of Engineering Science > Chair Metals and Alloys > Chair Metals and Alloys - Univ.-Prof. Dr.-Ing. Uwe Glatzel
Profile Fields
Profile Fields > Advanced Fields
Profile Fields > Advanced Fields > Advanced Materials
Research Institutions
Research Institutions > Research Centres
Research Institutions > Research Centres > Bayreuth Center for Material Science and Engineering - BayMAT
Result of work at the UBT: No
DDC Subjects: 600 Technology, medicine, applied sciences
600 Technology, medicine, applied sciences > 620 Engineering
Date Deposited: 09 Oct 2015 08:54
Last Modified: 24 Jan 2018 09:06
URI: https://eref.uni-bayreuth.de/id/eprint/5194