at Google ScholarTitle data
Tag, Andreas ; Weigel, Robert ; Hagelauer, Amelie ; Bader, Bernhard ; Pitschi, Maximilian ; Wagner, Karl C.:
Determination of Temperature Coefficients of thin film Materials in RF BAW Components.
In:
2015 German Microwave Conference. -
Piscataway, NJ
: IEEE
,
2015
. - pp. 402-405
ISBN 978-3-9812-6686-3
DOI: https://doi.org/10.1109/GEMIC.2015.7107838
Abstract in another language
A new, accurate, and fast approach for determining the temperature coefficients of the thin film materials used in RF BAW components has been developed allowing the precise modeling of BAW components at different ambient temperatures. The presented method is based on the investigation of several resonance frequencies of the resonators with different layer-stacks. The problem of determining the temperature coefficients from broadband resonator simulations and measurements was formulated as an overdetermined linear system of equations and solved by using the weighted least square method. The presented approach has been verified by measurements.
Further data
| Item Type: | Article in a book |
|---|---|
| Refereed: | Yes |
| Institutions of the University: | Faculties > Faculty of Engineering Science Faculties > Faculty of Engineering Science > Former Professors > Chair Communication Electronics - Univ.-Prof. Dr.-Ing. Amélie Marietta Hagelauer Faculties Faculties > Faculty of Engineering Science > Chair Communication Electronics Faculties > Faculty of Engineering Science > Former Professors |
| Result of work at the UBT: | No |
| DDC Subjects: | 600 Technology, medicine, applied sciences 600 Technology, medicine, applied sciences > 620 Engineering |
| Date Deposited: | 30 Sep 2019 12:28 |
| Last Modified: | 10 Aug 2022 12:54 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/52406 |