Titelangaben
Chauhan, Vikrant ; Tag, Andreas ; Mayer, Markus ; Pitschi, Maximilian ; Weigel, Robert ; Hagelauer, Amelie:
Modeling Nonlinear Behavior of RF Bulk Acoustic Wave Resonators.
In:
2016 IEEE International Ultrasonics Symposium (IUS). -
Piscataway, NJ
: IEEE
,
2016
ISBN 978-1-4673-9897-8
DOI: https://doi.org/10.1109/ULTSYM.2016.7728406
Abstract
In this work, the Poly-Harmonic Distortion (PHD) model has been used to characterize the nonlinearities of Bulk Acoustic Wave (BAW) solidly mounted resonators (SMR). The new approach of using X-parameters for characterization and simulation of nonlinearities is described. The amplitude and phase of the fundamental mode and its harmonics up to third order have been measured and simulated by using the X-parameter framework. The simulation and measurement results for phase and amplitude of X-parameters describing the relations between incident and reflected harmonics of the same as well as different orders are shown. The X-parameter measurements of BAW components up to third order harmonics have been carried out with a nonlinear vector network analyzer (NVNA). These measurements under large-signal operating conditions were used to determine the nonlinear material constants responsible for the nonlinearity in BAW resonators.
Weitere Angaben
Publikationsform: | Aufsatz in einem Buch |
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Begutachteter Beitrag: | Ja |
Institutionen der Universität: | Fakultäten > Fakultät für Ingenieurwissenschaften > Ehemalige Professoren > Lehrstuhl Kommunikationselektronik - Univ.-Prof. Dr.-Ing. Amélie Marietta Hagelauer Fakultäten Fakultäten > Fakultät für Ingenieurwissenschaften Fakultäten > Fakultät für Ingenieurwissenschaften > Lehrstuhl Kommunikationselektronik Fakultäten > Fakultät für Ingenieurwissenschaften > Ehemalige Professoren |
Titel an der UBT entstanden: | Nein |
Themengebiete aus DDC: | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften |
Eingestellt am: | 01 Okt 2019 09:22 |
Letzte Änderung: | 17 Okt 2022 09:34 |
URI: | https://eref.uni-bayreuth.de/id/eprint/52480 |