bei Google ScholarTitelangaben
Ringelmann, Tim ; Bäumler, Andreas ; Bakran, Mark-M.:
Surge Current Robustness of 1.2 kV SiC JFETs for Active Short Circuit Events in Automotive Applications.
2025
Veranstaltung: PCIM Conference 2025
, 06.05.-08.05.2025
, Nürnberg.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung
,
Paper
)
DOI: https://doi.org/10.30420/566541043
Abstract
A mixed 1.2 kV SiC JFET/MOSFET half bridge (HB) represents a novel approach in comparison to a
uniform 1.2 kV SiC MOSFET HB. In automotive inverters in an event of a control failure, a safe state
must be initiated, which is referred to as active short circuit (ASC). With the normally-on JFET the mixed
JFET/MOSFET HB is capable of initiating this safe state at a gate supply voltage outage by itself. To
estimate the robustness in case of ASC events usually surge current measurements are done. Therefore,
this paper deals with the surge current robustness of SiC JFETs in comparison to state of the art SiC
MOSFETs. Bidirectional, half-sinusoidal surge current tests under different pulse length and starting case
temperatures are performed. The worst case conduction direction is determined, a failure analysis is done
and a safe operating area is defined. Finally a evaluation of the surge current robustness relative to an
automotive nominal inverter current is discussed.
Weitere Angaben
| Publikationsform: | Veranstaltungsbeitrag (Paper) |
|---|---|
| Begutachteter Beitrag: | Ja |
| Institutionen der Universität: | Fakultäten > Fakultät für Ingenieurwissenschaften > Lehrstuhl Mechatronik > Lehrstuhl Mechatronik - Univ.-Prof. Dr.-Ing. Mark-M. Bakran Profilfelder > Advanced Fields > Neue Materialien Profilfelder > Emerging Fields > Energieforschung und Energietechnologie Forschungseinrichtungen > Forschungsstellen > Zentrum für Energietechnik - ZET |
| Titel an der UBT entstanden: | Ja |
| Themengebiete aus DDC: | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften |
| Eingestellt am: | 17 Jul 2025 07:00 |
| Letzte Änderung: | 17 Jul 2025 07:00 |
| URI: | https://eref.uni-bayreuth.de/id/eprint/94211 |