In-Situ-Measurement of the Si-Infiltration Process of C/C-Preforms and 3-D Analysis of the Resulting C/SiC Microstructure

Titelangaben

Hausherr, Jan-Marcel ; Meinhardt, J. ; Hassnik, B. ; Herrmann, C. ; Daimer, J. ; Raether, G. ; Krenkel, Walter:
In-Situ-Measurement of the Si-Infiltration Process of C/C-Preforms and 3-D Analysis of the Resulting C/SiC Microstructure.
In: Bućko, M. M. (Hrsg.): Proceedings of the 11th International Conference of the European Ceramic Society. - Krakow : Polish Ceramic Society , 2009 . - S. 536-543
ISBN 978-83-60958-54-4