Veröffentlichungen "Hain, Stefan"

2018

Hofstetter, Patrick ; Hain, Stefan ; Bakran, Mark-M.:
Applying the 2D-Short Circuit Detection Method to SiC MOSFETs including an advanced Soft Turn Off.
2018
Veranstaltung: PCIM Europe 2018 , 05.06.-07.06.2018 , Nürnberg, Deutschland.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

2017

Hain, Stefan ; Bakran, Mark-M.:
The Benefit of Using an IGBT with a High Desaturation Current.
2017
Veranstaltung: EPE 2017 ECCE Europe : 19th European Conference on Power Electronics and Applications , 11.09.2017 - 14.09.2017 , Warschau, Polen.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

Hain, Stefan ; Bakran, Mark-M.:
Suitable Turn-Off Strategies for IGBTs with High Desaturation Current During Short Circuit Failures Detected with the 2D-Short Circuit Detection Method.
2017
Veranstaltung: PCIM Europe 2017 , 16.-18.05.2017 , Nürnberg, Deutschland.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

2016

Hain, Stefan ; Bakran, Mark-M.:
Integrating the New 2D-Short Circuit Detection Method into a Power Module with a Power Supply fed by the Gate Voltage.
2016
Veranstaltung: IEEE 2nd Annual Southern Power Electronics Conference (SPEC) , 05.12.-08.12.2016 , Auckland, Neuseeland.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Vortrag )

Hain, Stefan ; Bakran, Mark-M.:
New Ultra Fast Short Circuit Detection Method Without Using the Desaturation Process of the Power Semiconductor.
2016
Veranstaltung: PCIM Europe 2016 , 10.-12. Mai 2016 , Nürnberg.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Vortrag )

Hain, Stefan ; Bakran, Mark-M.:
The Suitability and Challenges of the New 2D-Short Circuit Detection Method for Protecting a High Performance IGBT with a low Vce, sat Value.
2016
Veranstaltung: EPE 2016 ECCE Europe 18th European Conference on Power Electronics and Applications , 5.-9.9.2016 , Karlsruhe.
(Veranstaltungsbeitrag: Kongress/Konferenz/Symposium/Tagung , Paper )

2015

Hain, Stefan ; Bakran, Mark-M. ; Jäger, Christian ; Niedernostheide, Franz-J. ; Domes, Daniel ; Heer, Daniel:
The effect of different stray inductances on the performance of various types of IGBTs — Is less always better?
In: Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on. - Piscataway : IEEE , 2015 . - S. 1-9
DOI: https://doi.org/10.1109/EPE.2015.7309166

Hain, Stefan ; Bakran, Mark-M.:
New Approaches to Improve the Performance of Inductive Current Sensors.
In: PCIM Europe 2015 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg, 19 – 21 May 2015. - Berlin : VDE , 2015
ISBN 978-3-8007-3924-0

Hain, Stefan ; Bakran, Mark-M.:
New Rogowski Coil Design with a High dV/dt Immunity and High Bandwidth.
In: EPE Journal. Bd. 25 (2015) Heft 1 . - S. 22-27.
ISSN 0939-8368
DOI: https://doi.org/10.1080/09398368.2015.11782458

2014

Hain, Stefan ; Bakran, Mark-M.:
Highly Dynamic Current Measurements with Inductive Current Sensors : a Numerical Recipe.
In: PCIM Europe : Proceedings. - Berlin ; Offenbach : VDE Verlag , 2014
ISBN 978‐3‐8007‐3603‐4

2013

Hain, Stefan ; Bakran, Mark-M.:
New Approaches for Highly Dynamic Current Measurements of Extremely Fast Switching IGBTs.
In: PCIM Europe 2013 : International Exhibition & Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. - Nürnberg : VDE Verlag GmbH , 2013 . - S. 833-840
ISBN 978-3-8007-3505-1

Hain, Stefan ; Bakran, Mark-M.:
New Rogowski Coil Design with a High dV/dt Immunity and High Bandwidth.
In: 15th European Conference on Power Electronics and Applications (EPE) 2013 : Proceedings. - Lille, Frankreich , 2013

2012

Ernst, Dominique ; Hain, Stefan ; Köhler, Jürgen:
Setup for single-particle orbit tracking : artifacts and corrections.
In: Journal of the Optical Society of America A. Bd. 29 (2012) Heft 7 . - S. 1277-1287.
ISSN 1520-8532
DOI: https://doi.org/10.1364/JOSAA.29.001277